Company Profile

TSI Incorporated

Lower Your Risk and Don't Fail an Audit — Contamination Control for Monitoring Ultra-Clean Semi Environments

Based in Shoreview, MN, USA

Services

About

Reliable, Confident Environmental Monitoring for Ultra-Clean Semiconductor Environments
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TSI Inc., international leader in measurement technology for nearly 60 years and recognized leader in high-sensitivity particle counting, offers a range of instruments to reduce the risk during fabrication processes by detecting sub-micron and nanoparticles that contaminate products, including but not limited to semiconductor applications.

Minimize your risk, easily pass audits, and reduce product waste with TSI’s new AeroTrak®+ Remote Airborne Particle Counters—top-choice for uninterrupted, reliable particle counting during semiconductor or electronics manufacturing. Covered by an industry-exclusive 5-year laser warranty.

TSI also offers other high-sensitivity particle counting instruments. TSI 0.1 µm airborne particle counters and 10 nm cleanroom condensation particle counters are designed to meet the critical needs of the semiconductor industry by providing complete contamination detection ≥10 nm. TSI FMS Software with OPC UA Client/Server functionality makes it easy to exchange data to continuously monitor semiconductor manufacturing cleanrooms—and pass audits.

Learn more about how to lower your risk and easily pass an audit >

Featured partner materials

Video - Meet the TSI AeroTrak Cleanroom Condensation Particle Counter

10 nm Measurement Like No Other! The only water-based, high flow rate nanoparticle counter that reports contamination ≥10 nm.

Video - Compare TSI Model 9001 Cleanroom CPC vs 0.1 Micron Particle Counter

Model 9001 provides incredibly low false-counts and real-time 10 nm sensitivity nanoparticle detection at a 0.1 cfm flow rate—something 0.1 µm particle counting instruments cannot.

App Note - TSI AeroTrak Water-Based Cleanroom CPC Like No Other!

Only ultra-pure/de-ionized water-based cleanroom CPCs keep possible sources of contamination out of the cleanroom, while providing 24/7 continuous operation with minimal maintenance.

Spec Sheet - TSI AeroTrak® Cleanroom CPC

Using patented technology, this cleanroom CPC provides 10 nm sensitivity at a 0.1 CFM (2.83 L/min) flow rate — like no other instrument can.

Spec Sheet - TSI AeroTrak High Pressure Diffuser

Do you need to measure particulate contamination in high-pressure compressed gas systems within a semiconductor manufacturing space? It is possible.
Id Year Materials Info Company Author Tags View
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Video - Compare TSI Model 9001 Cleanroom CPC vs 0.1 Micron Particle Counter
Model 9001 provides incredibly low false-counts and real-time 10 nm sensitivity nanoparticle detection at a 0.1 cfm flow rate—something 0.1 µm particle counting instruments cannot.
... View
...
App Note - TSI AeroTrak Water-Based Cleanroom CPC Like No Other!
Only ultra-pure/de-ionized water-based cleanroom CPCs keep possible sources of contamination out of the cleanroom, while providing 24/7 continuous operation with minimal maintenance.
... Data Management; Nanoparticle; Nanoparticles; Particle Count and Detection; Particles; Yield View
...
Spec Sheet - TSI AeroTrak High Pressure Diffuser
Do you need to measure particulate contamination in high-pressure compressed gas systems within a semiconductor manufacturing space? It is possible.
... Fab Operation; Nanoparticle; Nanoparticles; Particles; Particle Count and Detection; Yield View
...
Spec Sheet - TSI AeroTrak® Cleanroom CPC
Using patented technology, this cleanroom CPC provides 10 nm sensitivity at a 0.1 CFM (2.83 L/min) flow rate — like no other instrument can.
... Data Management; Fab Operation; Nanoparticle; Nanoparticles; Particle Count and Detection; Particles; Yield View
...
Video - Meet the TSI AeroTrak Cleanroom Condensation Particle Counter
10 nm Measurement Like No Other! The only water-based, high flow rate nanoparticle counter that reports contamination ≥10 nm.
... View
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