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2022 |
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Keynote Panel: Yield and Reliability- Enabling Advanced Semiconductor Yield
A discussion of how contamination and defectivity control might be done differently in the future, to enable advanced semiconductor yield.
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FTD Solutions;
SCREEN SPE;
Applied Materials;
Samsung Austin Semiconductor;
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Slava Libman;
James Snow;
Nabil Mistkawi, Abbas Rastegar
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Yield; Wafer Defectivity; Organic Contamination; End-user |
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2020 |
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AMC & High Purity Gases Control - Q&A
This Q&A session took place at the 2020 Ultrapure Micro annual conference. It was a part of the AMC, Liquid Chemicals & Gases Control track, and included speakers from the Airborne Molecular Contamination (AMC) and High Purity Gases Control session.
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Texas A&M University;
Air Liquide;
Tiger Optics;
Syft Technologies
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Walter Den;
Florian Adler;
Helena Barnes; Maohua Pan
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Airborne Molecular Contamination (AMC); Metrology and Analytical Technology; High Purity Gases |
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2020 |
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New sampling module for ultra-low level cation, anions, and organic acids in air/gases
This presentation was given at the Ultrapure Micro 2020 annual conference. It was presented in the AMC, Liquid Chemicals & Gases Control track, as part of the Airborne Molecular Contamination (AMC) and High Purity Gases Control session.
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Air Liquide;
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Maohua Pan
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Airborne Molecular Contamination (AMC); Ammonia; Organic Contamination; Case Study |
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