Keynote Panel: Yield and Reliability- Enabling Advanced Semiconductor Yield

Date published: 2022

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A discussion of how contamination and defectivity control might be done differently in the future, to enable advanced semiconductor yield.

Companies: FTD Solutions; SCREEN SPE; Applied Materials; Samsung Austin Semiconductor;

Authors: Slava Libman; James Snow; Nabil Mistkawi, Abbas Rastegar

Tags: Yield; Wafer Defectivity; Organic Contamination; End-user