| 2022 |
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PFAS: Upcoming Regulations and the SEMI Industry Response
Presentation given at January 20th 2022 online UPM Community event.
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Chemours;
Intel;
Enviro-Energy Solutions;
Evoqua Water Technologies;
GHD;
GF Piping Systems;
Kinetics;
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Bob McIntosh;
Amber Wellman;
Kevin Wolfe;
Katrin Wallheinke;
Ryan Thomas;
Alan Knapp;
David Kandiyeli
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PFAS; Wastewater; Environmental Impact and Compliance; SEMI; Distribution Systems |
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| 2021 |
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300mm unpatterned wafer defect review and characterization with universal surface enhanced Raman spectroscopy
This presentation was given as part of the Ultrapure Micro 2021 annual conference. It was given as part of the ultra high purity chemicals strand.
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UNISERS;
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Ali Altun;
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Wafer Defectivity; Particle Precursors; Particle Count and Detection; IRDS |
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| 2021 |
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Water and wastewater supply chain management
This presentation was given as part of the Ultrapure Micro 2021 annual conference. It was given as a keynote presentation as part of the water and wastewater management strand.
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Intel;
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Assaf Harel;
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Supply Chain; End-user; Risk Management |
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| 2021 |
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Intel Keynote 2021
This presentation was given as part of the Ultrapure Micro 2021 annual conference. It was given as a keynote presentation
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Intel;
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Dominic Greensmith;
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Supply Chain; End-user; Risk Management |
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| 2021 |
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Evaluating three generations of UPW filtration technology using SEMI C79
This presentation was given as part of the Ultrapure Micro 2021 annual conference. It was given as part of the ultra high purity chemicals strand.
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Intel;
CT Associates;
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Ryan Pavlick;
Gary van Schooneveld;
Sriram Ramamoorthy;
David Neitling; Hokkin Choi; Vani Thirumala; Vindhya
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SEMI; Filtration; End-user |
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| 2021 |
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Enabling advanced semiconductor yield via proactive technology management
This presentation was given as part of the Ultrapure Micro 2021 annual conference. It was given as a keynote presentation
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FTD Solutions;
CT Associates;
Page;
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Slava Libman;
Gary van Schooneveld;
Dan Wilcox;
Bonnie Marion;
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IRDS; SEMI; Risk Management; Particle Precursors; Wafer Defectivity |
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| 2020 |
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Yield Enhancement in Wet Cleaning of Silicon Wafers by Critical Area Analysis
This presentation was given at the Ultrapure Micro 2020 annual conference. It was presented in the Ultrapure Water Production track, as part of the Wafer Contamination Control - Particles Monitoring session.
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FTD Solutions;
Sinha Solutions
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Slava Libman;
Drew Sinha
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Particle Count and Detection; IRDS; Wafer Defectivity |
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| 2020 |
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Removal of trace metals from Ultra Pure Water (UPW) using membrane-based solutions
This presentation was given at the Ultrapure Micro 2020 annual conference. It was presented in the Ultrapure Water Production track, as part of the UPW Contamination Control session.
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Entegris;
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Ashutosh Bhabhe;
Brant Kim; Jad Jaber; James Hamzik; Justin Brewster; Nathaniel Goff; Siddarth Sampath
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Metal Contamination; Silica; IRDS; SEMI; Filtration |
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| 2020 |
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Semiconductor Market Trends - Optimistic Uncertainty of 2020 and Beyond
This presentation was given at the Ultrapure Micro 2020 annual conference. It was presented as a Keynote presentation.
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SEMI
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Dave Anderson
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SEMI; Market Trends; Supply Chain |
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| 2020 |
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Technology Roadmap - Focusing on Enabling Yield of Next Generation Devices
This presentation was given at the Ultrapure Micro 2020 annual conference. It was presented as a Keynote presentation.
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Entegris;
Intel;
Enviro-Energy Solutions;
Page;
FTD Solutions;
Applied Materials;
Infineon Technologies;
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Slava Libman;
Dan Wilcox;
Andreas Neuber;
Bob McIntosh;
Christoph Hocke; Kevin Prettyman; Nabil Mistkawi
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IRDS; Particle Precursors; Wafer Defectivity |
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