Substrate Environment Contamination Control - The Manufacturing Tools Perspective
Date published: 2020
This webinar features a presentation from Nabil Mistkawi, Samsung Austin Semiconductor, who identifies key technology requirements for wet chemicals and gases from an end user perspective. This was followed by an engaging discussion between tool OEM companies and end users, as they explored the contamination control needs of individual environments, showing where contamination impacts the process, thereby bringing together the supply chain with the clean room.
Authors: James Snow; Rushi Matkar; Dan Wilcox; Slava Libman; Abbas Rastegar; Jim Snow; Marcel Teunissen; Nabil Mistkawi
Tags: IRDS; Metrology and Analytical Technology; Wafer Defectivity; End-user; Ultraviolet (UV)