Yield & Reliability Drivers and the Implications for Facility 2.0

Thursday April 07 2022 08:00-09:30 Pacific Time

The first community event will discuss the complexity of the advanced devices and the technology needs to enable quality output. The panel will discuss critical developments, including: growing demand for a greater range of devices with longer life expectancy and higher performance; 3D architectures and device complexity driving the need for micro-contamination control; digitization and data flow management changing the organization of facilities; and proactive quality management for higher performance treatment systems and high purity materials.

This online meeting will feature three short presentations from IRDS experts, followed by expert-led panel discussions, before finally concluding with a brainstorming of ideas in the networking roundtable session.
Confirmed speakers and roundtable topics:
  • Slava Libman, CEO, FTD Solutions
  • Dan Wilcox, Principal - Director Process Engineering, Page
  • Mustafa Badaroglu, Principal Engineer/Architect, Qualcomm
  • Supika Mashiro, EHS Strategy Planning and Standard Strategy Expert, Tokyo Electron

How to register

Sign in to register for this meeting

Login

or

Submit your details using the form below to request access to this event