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Expert perspectives: What are the industry’s most pressing metrology challenges?

5 examples of industry change: April UPM Community Event

Chart of the month: May 2022

News-in-brief: May 2022

UPM Webinar Series – Facility 2.0: Webinar #1 - Enabling Yield in Next Generation of Semiconductor Manufacturing

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Chart of the month: May 2022

An example of predictive yield modelling, as presented by Dan Wilcox, Principal – Director Process Engineering at Page, at the last UPM Community Event.
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Taken from a presentation by Dan Wilcox, Principal of Director Process Engineering at Page, at the last UPM Community Event. Watch the April UPM Community Event recording: 'Deconstructing...
May 2022

5 examples of industry change: April UPM Community Event

On April 12th 2022, UPM held an Community Event with a panel of IRDS experts. Below are some interesting examples of how the semiconductor manufacturing industry is evolving, as well as implications for defect control and yield enhancement.
The semiconductor manufacturing industry is evolving fast, which has spurred greater collaboration between experts. This event brings together experts from three different areas of the...
May 2022

Expert perspectives: What are the industry’s most pressing metrology challenges?

UPM Community Platform Manager Orla McCoy caught up with experts at the 2022 Advanced Semiconductor Manufacturing Conference to understand why metrology is such a significant challenge for the industry.
Siddarth Sampath, Applications Team Lead Liquid Filtration and Purification, and Jennifer Braggin, Director of Technical Training from Entegris agree that metrology is the biggest challenge...
May 2022