Understanding Nanoparticle Contamination in Ultrapure Water Generation and Distribution

Date published: 2020

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This presentation was given at the Ultrapure Micro 2020 annual conference. It was presented in the Ultrapure Water Production track, as part of the UPW Contamination Control session.

Companies: Intel; Particle Measuring Systems;

Authors: Glen Slayter; Dan Rodier;

Tags: Enduser; Nanoparticles; Optical Particle Counter (OPC); Metrology; Case Study; Filter Performance